Product Description
Test Equipment
TEA offers a complete line of test systems for the measurement of semiconductor junction temperature and thermal impedance under steady-state and transient conditions. the measurement capabilities of each system is tailored to the specific device attributes necessary for proper thermal measurements. The systems are designed to provide thermal characterization measurement data for engineering applications and for production-level high volume testing applications. Each system is supplied with Calibration Verification Fixtures, LCD monitor, keyboard, mouse and printer. The collected thermal data can be stored locally and shared globally using corporate networks. Standard model are:
| Model | Device Type | Heating Capability |
| TTS- 1000 | Diode, LED, TTC | Up to 10 A @ <8V |
| TTS- 1010 | LED | Up to 10 A @ <8V Up to 5 A @ <70V |
| TTS- 1050 | Diode, Rectifier | Up to 50 A @ <3V |
| TTS- 1100 | Laser Doide | Up to 3 A @ <5V |
| TTS- 2550 | BJT, MOSFET, IGBT | Up to 400 W |
| TTS- 4200 | IC | Up to 100W Up to 10 A @ <8V |
Custom and microwave device models also available.
